High resolution Field Emission Scanning Electron Microscope (FESEM) with in-situ tension-compression testing attachment

High resolution Field Emission Scanning Electron Microscope (FESEM) with in-situ tension-compressiontesting attachment Corrigendum 1- Pre Bid Meeting   Corrigendum 2 - Postponement of Pre Bid Meeting  Corrigendum 3- Pre Bid Meeting   Corrigendum 4 - Due date extendedCorrigendum 5 - Due date extensionCorrigendum 6 - Amendment in Technical Specification and Extension Of Bid Submission DateCorrigendum 7 - Due date extensionCorrigendum 8 - Amendment in Technical Specification and Extension Of Bid Submission Date

Reference: 
ICSR/2022/IOE/006/FESEMEDSEBSD
Opening Date: 
21/06/22
Closing Date: 
30/08/22
Address: 
The Senior Manager, Project Purchase, ICSR, IIT M