High resolution Field Emission Scanning Electron Microscope (FESEM) with in-situ tension-compression testing attachment
Submitted by Anonymous on Tue, 2022-06-21 14:12
High resolution Field Emission Scanning Electron Microscope (FESEM) with in-situ tension-compressiontesting attachment Corrigendum 1- Pre Bid Meeting Corrigendum 2 - Postponement of Pre Bid Meeting Corrigendum 3- Pre Bid Meeting Corrigendum 4 - Due date extendedCorrigendum 5 - Due date extensionCorrigendum 6 - Amendment in Technical Specification and Extension Of Bid Submission DateCorrigendum 7 - Due date extensionCorrigendum 8 - Amendment in Technical Specification and Extension Of Bid Submission Date
Reference:
ICSR/2022/IOE/006/FESEMEDSEBSD
File:
Opening Date:
21/06/22
Closing Date:
30/08/22
Address:
The Senior Manager, Project Purchase, ICSR, IIT M
Administrative Unit: