High resolution Field Emission Scanning Electron Microscope (FESEM) with in-situ tension- compression testing attachment

Submitted by Anonymous on Mon, 2022-11-14 15:38

High resolution Field Emission Scanning Electron Microscope (FESEM) with in-situ tension- compression testing attachment  CORRIGENDUM 1- Pre-bid Meeting  Corrigendum -2 Extension of bid submission date & Amendment in Technical Specification  Corrigendum -3 Extension of bid submission date

Reference: 
GTB8/ICSR/2022/03/HIGHRESOLUT
File: 
TENDER DOCUMENT
ANNEXURE-1
CPP PROOF
Corrigendum 1
Corrigendum proof
corrigendum-2
corrigendum -2 proof
corrigendum-3
corrigendum -3 ePublish proof
Opening Date: 
14/11/22
Closing Date: 
06/01/23
Address: 
The Manager, Project Purchase, ICSR, IIT M CH-36
Keywords: 
High resolution Field Emission Scanning Electron Microscope (FESEM) with in-situ tension- compression testing attachment
Administrative Unit: 
New Academic Complex Room No 119 IIT Madras