FTIR WITH ATR ARRANGEMENT
DATA ACQUISITION SYSTEM WITH SCANNER CARD
Multichannel Electrochemical Workstation
Battery Operated Electrometer / High Resistance Meter
High-Resolution Electron Microscope For Channelling Contrast Imaging And In-Situ Experimentation
High temperature furnace (2000 °C) with controlled atmosphere
MICROTEXTURE ANALYSIS SOFTWARE
Electrochemical Workstation
Closed Cycle Refrigerator
Source Measure Unit (SMU) and Electrometer