High-resolution X-ray diffractometer for thin film and powder analysis

Submitted by smpur-icsr on Sat, 2023-02-04 18:03

High-resolution X-ray diffractometer for thin film and powder analysis

Reference: 
GTB9/MURU/2023/13/PWRANALYSIS
File: 
Tender document
AnnexureI
ePublish Proof
Opening Date: 
04/02/23
Closing Date: 
07/03/23
Keywords: 
High-resolution X-ray diffractometer for thin film and powder analysis
Administrative Unit: 
Department of Physics